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Basic equations for multiple successive diffraction and angle distortion minimization in X-ray magnifiers

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Czechoslovak Journal of Physics Aims and scope

Abstract

In the paper, conditions for three-dimensional coplanar and non-coplanar successive multiple X-ray diffraction and the basic imaging equations for multiple X-ray diffraction modelling by a computer are given. As an example, one crystal X-ray magnifier with two non-coplanar asymmetric diffractions has been studied more deeply with the aim to minimize the angle distortion in the magnified image. Experimental results obtained with such an optimized magnifier are presented.

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Authors and Affiliations

  1. Department of Physical Electronics, EPRC, Slovak Academy of Sciences, Vrbovská cesta, 921 01, Piešt'any, Czechoslovakia

    D. Korytár

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  1. D. Korytár
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Additional information

It is a pleasure to thank Dr. M. OŽvold for the encouragement during this work, Ing. M. Hrivnák for the help with computer programs, and Mrs. H. Končeková for the help in cutting and polishing of the crystal.

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Korytár, D. Basic equations for multiple successive diffraction and angle distortion minimization in X-ray magnifiers. Czech J Phys 40, 495–512 (1990). https://doi.org/10.1007/BF01599773

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  • DOI: https://doi.org/10.1007/BF01599773

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