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The normal inhomogeneity studies of the refractive index in titanium dioxide films

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Czechoslovak Journal of Physics B Aims and scope

Abstract

The possibility of determination of index changes at normal direction in thin dielectric films from air reflectance spectra has been studied. The modification of the graphic envelopes of normal reflectance spectra for faster calculations of the index inhomogeneity of thin films is presented. Obtained results are used for studies of the influence of the substrate temperature and starting evaporation material on the index inhomogeneity of titanium dioxide films.

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Authors and Affiliations

  1. Meopta Optics and Precision Mechanics Works, 750 58, Přerov, Czechoslovakia

    J. Jankuj

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  1. J. Jankuj
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The author acknowledges Dr. I. Ohlídal and Dr. K. Navrátil of the Department of Solid State Physics, Purkyně University in Brno for stimulating discussions.

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Jankuj, J. The normal inhomogeneity studies of the refractive index in titanium dioxide films. Czech J Phys 36, 855–862 (1986). https://doi.org/10.1007/BF01598335

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  • DOI: https://doi.org/10.1007/BF01598335

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