Abstract
Magnetoresistance of sputtered films of a-Ge has been studied. The experiments were performed in the temperature range 78–450 K and in magnetic fields up to 7 kG. The magnetoresistance has been found to be negative up to 450 K and changes its sign at 80 K. The experiments are confronted with a model based on the Zeeman splitting of localized electronic levels in the applied magnetic field. It is shown that such model can lead to relatively good agreement between the theory and the experiment.
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We are grateful to B.Velický for discussions about the subject matter of this paper and to J.Zemek for preparation of germanium samples.
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Kubeli, I., Tříska, A. Magnetoresistance in amorphous germanium. Czech J Phys 23, 115–122 (1973). https://doi.org/10.1007/BF01596885
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DOI: https://doi.org/10.1007/BF01596885