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Lateral lattice parameter variation measurement by means of a double crystal X-ray method with oscillating slit

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Czechoslovak Journal of Physics B Aims and scope

Conclusion

A relatively simple and highly sensitive X-ray double crystal method with the oscillating slit has been described and shown to be suitable for lateral lattice parameter variation measurements. The applicability of the method to crystal defects investigations has been suggested.

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References

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Authors and Affiliations

  1. Department of Physical Electronics, CEPR, Slovak Acad. Sci., Čs. armády 110a, 921 01, Piešt'any, Czechoslovakia

    D. Korytár

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  1. D. Korytár
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It is a pleasure to thank Dr. R. Bubáková (Institute of Physics, Czechoslovak Academy of Sciences, Prague) for helpful discussions and advice and Drs. A. Linek (Institute of Physics, Czechoslovak Academy of Sciences, Prague) and M. Ožvold for their encouragement during this work. Thanks are also due to Ing. V. Daniška for his technical assistance, to Miss I. Arbetová for drawing the figures and Mrs. E. Králová for typing the manuscript.

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Korytár, D. Lateral lattice parameter variation measurement by means of a double crystal X-ray method with oscillating slit. Czech J Phys 34, 1277–1281 (1984). https://doi.org/10.1007/BF01590412

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  • DOI: https://doi.org/10.1007/BF01590412

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