References
Wosiński T.: Phys. Status Solidi (a)60 (1980) K 149.
Wagner R. J., Krebs J. J., Stauss G. H., White A. M.: Solid State Commun.36 (1980) 15.
Weber E. R., Ennen H., Kaufmann U., Windscheif J., Schneider J., Wosiński T.: J. Appl. Phys.53 (1982) 6140.
Wosiński T., Morawski A., Figielski T.: Appl. Phys. A30 (1983) 233.
Lagowski J., Gatos H. C., Parsey J. M., Wada K., Kaminśka M., Walukiewicz W.: Appl. Phys. Lett.40 (1982) 342.
Brozel M. R., Grant I., Ware R. M., Stirland D. J.: Appl. Phys. Lett.42 (1983) 610.
Holmes D. E., Chen R. T., Yang J.: Appl. Phys. Lett.42 (1983) 419.
Tajima M., Okada Y.: Physica B116 (1983) 404.
Martin G. M., Jacob G., Poiblaud G., Goltzene A., Schwab C.: Inst. Phys. Conf. Ser.59 (1981) 281.
Breitenstein O., Wosiński T.: Phys. Status Solidi (a)77 (1983) K 107.
Figielski T.: Appl. Phys. A29 (1982) 199.
Cullis A. G., Augustus P. D., Stirland D. J.: J. Appl. Phys.51 (1980) 2556.
Wosiński T.: Crystal Res. Technology16 (1981) 217.
Weber E. R., Schneider J.: Physica B116 (1983) 398.
Kaminska M., Skowroński M., Godlewski M., Kuszko W.:in Fourth “Lund” Int. Conf. on Deep Level Impurities in Semiconductors, Eger 1983, Abstracts, p. 180.
Weber J., Watkins G. D.:in Fourth “Lund” Int. Conf. on Deep Level Impurities in Semiconductors, Eger 1983, Abstracts, p. 179.
Skowroński M., Kamińska M., Kuszko W.:in Fourth “Lund” Int. Conf. on Deep Level Impurities in Semiconductors, Eger 1983, Abstracts.
Vincent G., Bois D., Chantre A.: J. Appl. Phys.53 (1982) 3643.
Taniguchi M., Ikoma T., Kikuchi K., Oyoshi T.: J. Appl. Phys. to be published.
Author information
Authors and Affiliations
Additional information
Invited talk at the International Conference on Radiative Recombination and Related Phenomena in III–V Compound Semiconductors, Prague, 4–7 October, 1983.
The authors are grateful to Dr. A. Morawski and J. Domagała from their laboratory for discussions and for making available experimental results prior to publication.
Rights and permissions
About this article
Cite this article
Figielski, T., Wosiński, T. Properties and nature of the main electron trap in GaAs. Czech J Phys 34, 403–408 (1984). https://doi.org/10.1007/BF01590081
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF01590081