Abstract
Resistivity changes observed after tensile deformation at 78 K and subsequent annealing at 200 K and 373 K of polycrystalline Cd 99·999 at % wires are reported. Formulae taking into account the changes in the mean crystallite orientation, the effect of the applied stress and of the lattice defects are given and the corresponding resistivity changes are analyzed.
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We express our sincere thanks to Dr. P.Lukáč (Charles University, Prague) for drawing our attention to the paper byAndrade andChalmers and for valuable comments and discussions. We are indebted to Dr. J. P.Simon (E. N. S. E. E. G., Saint-Martin-d'Hères) for critical reading of the manuscript.
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Sprušil, B., Moulis, J. & Vostrý, P. Effects contributing to resistivity changes of polycrystalline cadmium wires deformed in tension at 78 K. Czech J Phys 26, 875–881 (1976). https://doi.org/10.1007/BF01589691
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DOI: https://doi.org/10.1007/BF01589691