Abstract
This paper describes the new microwave bridge system with dielectric antennas of very small transverse dimensions (smaller than 10 mm) convenient for measurements of the complex dielectric permittivity of slab materials. The system enables (i) to measure by nondestructive way the complex permittivity of dielectric and semiconducting samples the dimensions of which are comparable or smaller than the wavelength of probing microwaves, (ii) to detect the material inhomogeneities. This system was verified at the frequency 37·5 GHz. In this paper measurements of the resistivity of the Si samples are given. Results obtained are in good agreement with the theory.
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Two of the authors (J.Musil and F.Žáček) wish to thank to the Director of the Institute of Plasma Physics Dr. J.Váňa for his interest in this work and for his kindness to enable them to make all measurements, the results of which are given in this paper, in laboratories of the Institute of Plasma Physics.
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Musil, J., Žáček, F., Bürger, A. et al. New microwave system to determine the complex permittivity of small dielectric and semiconducting samples. Czech J Phys 25, 916–926 (1975). https://doi.org/10.1007/BF01589309
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DOI: https://doi.org/10.1007/BF01589309