Abstract
Variable thickness bridges of superconducting Nb thin films have been fabricated for the first time by a combination of conventional photolithography and scanning force nanofabrication methods. The weak link behavior of these superconducting nanobridges was verified by low-temperature transport measurements, in particular by measuring the critical current as a function of an externally applied magnetic field. Future applications of miniaturized weak link structures may include highresolution scanning SQUID microscopes.
References
K.K. Likharev: Rev. Mod. Phys.51, 101 (1979)
R.C. Black, A. Mathai, F.C. Wellstood, E. Dantsker, A.H. Miklich, D.T. Nemeth, J.J. Kingston, J. Clarke: Appl. Phys. Lett.62, 2128 (1993)
R.C. Black, F.C. Wellstood, E. Dantsker, A.H. Miklich, J.J. Kingston, D.T. Nemeth, J. Clarke: Appl. Phys. Lett.64, 100 (1994)
L.N. Vu, M.S. Wistrom, D.J. Van Harlingen: Appl. Phys. Lett.63, 1693 (1993)
L.N. Vu, M.S. Wistrom, D.J. Van Harlingen: Physica B194-196, 1791 (1994)
J.R. Kirtley, C.C. Tsuei, J.Z. Sun, C.C. Chi, Lock See Yu-Jahnes, A. Gupta, M. Rupp, M.B. Ketchen: Nature373, 225 (1995)
H. Rogalla, B. David, J. Rühl: J. Appl. Phys.55, 3441 (1984)
J.R. Wendt, J.S. Martens, C.I.H. Ashby, T.A. Plut, V.M. Hietala, C.P. Tigges, D.S. Ginley, M.P. Siegal, J.M. Phillips, G.K.G. Hohenwarter: Appl. Phys. Lett.61, 1597 (1992)
J.R. Wendt, T.A. Plut, R.F. Corless, J.S. Martens, S. Berkowitz, K. Char, M. Johansson, S.Y. Hou, J.M. Phillips: J. Vac. Sci. Technol. B12, 3607 (1994)
J. Schneider, M. Mück, R. Wördenweber: Appl. Phys. Lett.65, 2475 (1994)
T.A. Jung, A. Moser, H.H. Hug, D. Brodoeck, R. Hofer, H.R. Hidber, U.D. Schwarz: Ultramicrosc.42–44, 1446 (1992)
W. Alters, C. Hahn, M. Löhndorf, S. Lukas, S. Pan, U.D. Schwarz, R. Wiesendanger: Nanotechnol. (in press)
R. Wiesendanger: Jpn. J. Appl. Phys.34, 3388 (1995)
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Hahn, C., Matsuyama, T., Merkt, U. et al. Nanofabrication of weak links based on scanning force methods. Appl. Phys. A 62, 289–292 (1996). https://doi.org/10.1007/BF01575097
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1007/BF01575097