Abstract
Silicon AFM tips can profitably be used as optical sensors for near field optical microscopy. In particular they are able to convert evanescent waves (also called virtual photons) into propagating ones which are conveniently guided in the tip and transferred to the air at the back of the cantilever. In this paper it is shown that virtual photons scattered at the tip end are also converted into real ones which are observed in the far field. Contrary to the previous observations of similar conversion at STM metal tips the scattered emission at dielectric silicon tips does not have a dependence with distance of a full exponential decay but rather follows the more complex dependence of the “dielectric capture”. This observation is consistent with Mie's theory of scattering of real photons by small particles. Experiments are performed with boths andp polarizations showing a regular dependence of the scattered intensity with the incidence angle. The same experiment is also performed with metallized silicon tips showing a metal scattering behaviour. This results can help to achieve a better control of the tip position in the close range of distances in a Photon Scanning Tunneling Microscopy (PSTM) experiment.
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Fillard, J.P., Castagné, M., Benfedda, M. et al. Virtual photon scattering at subwavelength sized tips. Appl. Phys. A 63, 421–425 (1996). https://doi.org/10.1007/BF01571667
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DOI: https://doi.org/10.1007/BF01571667