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Thermal diffusivity measurement of thermally conducting films on insulating substrates

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Abstract

We report thermal diffusivity measurements of thin Niobium films on glass substrates, using OptoThermal Transient Emission Radiometry (OTTER). The result is a thermal diffusivity value ofD=(2.79±0.36)×10−5 m2/s, which is within 17% of the accepted value for multicrystaline bulk niobium. The technique is remote sensing, non-destructive, and the measurements depend only on the thickness of the film and the thermal properties of the substrate.

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Authors and Affiliations

  1. Photophysics Research, School of EE & IE, South Bank University, 103 Borough Road, SE1 0AA, London, UK

    M. E. P. de Jesus & R. E. Imhof

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  1. M. E. P. de Jesus
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  2. R. E. Imhof
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de Jesus, M.E.P., Imhof, R.E. Thermal diffusivity measurement of thermally conducting films on insulating substrates. Appl. Phys. A 60, 613–617 (1995). https://doi.org/10.1007/BF01538537

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  • DOI: https://doi.org/10.1007/BF01538537

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