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Measurement and analysis of the electric field in semiconductor lasers by continuous-wave electro-optic probing

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Abstract

The electric field distribution in semiconductor lasers are detected experimentally by using CWEOP (Continuous-Wave Electro-Optic Probing). The paper briefly describes the experimental results. The obtained results reflect several characteristics of the lasers such as injection current, carrier confinement, and the variation of the distribution of the electric field corresponding to different bias conditions.

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References

  1. Z.H. Zhu: Appl. Phys. Lett.49, 432 (1986)

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Author notes

  1. S. Wang

    Present address: Department of Physics and Astronomy, The University of Aldsama, 35487, Tuscaloasa, AL, USA

Authors and Affiliations

  1. Department of Information and Electrical Engineering, Zhejiang University, 310027, P.R. China

    S. Wang & Z. H. Zhu

Authors
  1. S. Wang
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  2. Z. H. Zhu
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Wang, S., Zhu, Z.H. Measurement and analysis of the electric field in semiconductor lasers by continuous-wave electro-optic probing. Appl. Phys. A 60, 425–429 (1995). https://doi.org/10.1007/BF01538345

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  • DOI: https://doi.org/10.1007/BF01538345

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