Abstract
A subpicosecond KrF laser system (248 nm, 0.5 ps) was used as a light source for ablation of PMMA Mylar and Kapton. The time-dependent reflectivity of the light-induced plasma mirror as measured by 496 nm, 0.5 ps long probe pulses showed an increase of up to 94% with 0.4–1 ps rise time and 10–15 ps fall time. The highdensity plasma mirror shows perfect optical quality, and seems to be a promising light-controlled ultrafast switch for UV and visible light. The spectrum of the UV light reflected from the ablated spot is blue shifted by 0.5 nm and shows 1 nm broadening.
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R. Srinivasan, V. Mayne-Banton: Appl. Phys. Lett.41, 576 (1982)
D. Bauerle:Chemical Processing with Lasers, Springer Ser. Mater. Sci., Vol. 1 (Springer, Berlin, Heidelberg 1986)
G.H. Pettit, R. Sauerbrey. Appl. Phys. A56, 51 (1993)
R. Srinivasan, K.G. Casey, B. Braren, M. Yeh. J. Appl. Phys.67, 1604 (1990)
P. Simon: Appl. Phys. B48, 253 (1989)
C.A. Puliafito, D. Stern, R.R. Krueger, E.R. Mandel: Arch. Ophthalmol,105, 1255 (1987)
Zs. Bor, B. Hopp, B. Racz, G. Szabo, Zs. Marton, I Ratkay, J. Mohay, I. Suveges, A. Fust. Opt. Eng.32, 2481 (1993)
D.B. Geohegan. Appl. Phys. Lett.62, 1463 (1993)
G.H. Pettit, R. Sauerbrey: Appl. Phys. B58, 793 (1991)
S. Küper, M. Stuke: Appl. Phys. B44, 199 (1987)
L.M. Kukreja, P. Hess: Appl. Phys. Lett62, 205 (1993)
S. Küper, M. Stuke: Appl. Phys. B44, 199 (1987)
S. Küper, M. Stuke: Appl. Phys. Lett.54, 4 (1989)
J. Ihlemann, B. Wolf, P. Simon: Appl. Phys. A54, 363 (1992)
B. Luk'yanchuk, N. Bityurin, S, Anisimov, D. Bäuerle: Appl. Phys. A57, 367 (1993)
E. Sutcliffe, R. Srinivasan: J. Appl. Phys.60, 3315 (1986)
R. Yen, J.M. Lie, H. Kurz, N. Blombergen: Appl. Phys. A27, 153 (1982)
D. von der Linde, H., Schuler, H, Schulz, T, Engers: InUltrafast Phenomena VIII, Springer Ser. Chem. Phys., ed. by J.L. Martin, A. Migus, G.A. Mourou, A.H. Zewail, Vol. 55 (Springer, Berlin, Heidelberg 1993) p. 280
B.T.V. Vu, A. Szoke, O.L. Landen: InLaser Ablation Mechanisms and Applications II, AIP Conf. Proc., Vol. 288 (American Institute of Physics, New York 1993)
S. Szatmári, F.P. Schäfer: Opt. Commun.68, 196 (1988)
A.P. Schwarzenbach, T.S. Luk, I.A. McIntyre U. Johann, A. McPherson, K. Boyer, C.K. Rhodes: Opt. Lett.11, 499 (1986)
E.C. Harvey, C.J. Hooker, M.H. Key, A.K. Kidd, J.M.D. Lister, M.J. Shaw, W.T. Leland: J. Appl. Phys.70, 5238 (1991)
S. Watanabe, A. Endoh, M. Watanabe, N. Surakura: Opt. Lett.13, 580 (1988)
Zs. Bor: Opt. Lett.14, 119 (1989)
Zs. Bor, Z. Horvath: Opt. Commun.94, 249 (1992)
D. von der Linde, H. Schulz, T. Engers, H. Schuler: IEEE J. QE28, 2388 (1992)
R. Fedosejevs, R, Ottman, R. Siegel, G. Kuhnle, S. Szatmari, F.P. Schäfer: Phys. Rev. Lett.64, 1250 (1990)
M.M. Murnane, H.C. Kapteyn, R.W. Falcone: Phys. Rev. Lett.62, 155 (1989)
R. Srinivasan, B. Braren, K. Casey, M. Yeh: Appl. Phys. Lett.55, 2790 (1989)
D.L. Singleton, G. Paraskevopoulos, R.S. Taylors: Appl. Phys.B 50, 227 (1990)
O.L. Landen, W.E. Alley: Phys. Rev. A46, 5089 (1992)
S. Preuss, M. Spath, Y. Zhang, M. Stuke: Appl. Phys. Lett.62, 3049 (1993)
R. Fedosejevs, R. Ottman, R. Siegel, G Kuhnle, S Szatmari, F.P. Schäfer: Appl. Phys. B50, 79 (1990)
S. Szatmari, F.P. Schäfer, E. Muller-Horsche, W. Muckenheim: Opt. Commun.63, 305 (1987)
J.R.M. Barr, N.J. Everall, C.J. Hooker, I.N. Ross, M.J. Shaw, W.T. Toner: Opt. Commun.66, 127 (1988)
T.S. Luk, A. McPherson, G. Gibson, K. Boyer, C.K. Rhodes: Opt. Lett.14, 1113 (1989)
K. Mossavi, Th. Hofman, F.K. Tittel: Appl. Phys. Lett.62, 1203 (1993)
D.F. Muller, M. Rotschield, K. Boyer, C.K. Rhodes: IEEE J. QE-18, 1865 (1982)
R. Sauerbrey, J. Fure, S.P. LeBlanc, B. van Wonterghem, U. Teubner, F.P. Schäfer: Phys. Plasmas1, 1635 (1994)
Z. Ball, B. Hopp, M. Csete, F. Ignacz, B. Racz, R. Sauerbrey, G. Szabo: Appl. Phys. A (1994) (submitted)
F. O'Neill, I.C.E. Turcu, D. Xenakis, M.H.R. Hutchinson: Appl. Phys. Lett.55, 2603 (1989)
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Bor, Z., Racz, B., Szabo, G. et al. Femtosecond transient reflection from polymer surfaces during femtosecond UV photoablation. Appl. Phys. A 60, 365–368 (1995). https://doi.org/10.1007/BF01538335
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DOI: https://doi.org/10.1007/BF01538335