Abstract
Indium Phosphide layers grown by gas source Molecular Beam Epitaxy, (MBE) have been studied by positron lifetime spectroscopy using the recently modified pulsed positron beam in Munich. The as-grown samples are known to be phosphorous rich and contain a high concentration of vacancy-type defects. On annealing, phosphorous precipitates are formed and the concentration of free volume defects increases. Positron lifetime spectroscopy has identified the grown in defects to be indium vacancies at a concentration around 1018cm−3. The dominant defects after annealing exhibit a positron lifetime characteristic of divacancies and are present at concentrations in excess of 5×1019cm−3.
Similar content being viewed by others
References
B. W. Liang, P. Z. Lee, D. W. Shih, C. W. Tu: Appl. Phys. Lett.60, 2104 (1992)
T. Uchida, N. Yokouchi, T. Miyamoto, F. Koyama, K. Iga: J. Cryst. Growth129, 275 (1993)
P. Dreszer, W. M. Chen, K. Seendripu, J. A. Wolk, W. Walukiewicz, B. W. Liang, C. W. Tu, E. R. Weber: Phys. Rev. B47, 4111 (1993)
A. P. Seitsonen, R. Virkkunen, M. J. Puska, R. M. Nieminen: Phys. Rev. B49, 5253 (1994)
P. Hautojärvi, J. Mäkinen, S. Palko, K. Saarinen, C. Corbel, L. Liszkay: Mater. Sci. Eng. B22, 16 (1993)
A. Claverie, J. Crestou, J. C. Garcia: Appl. Phys. Lett.62, 1638 (1993)
P. J. Schultz, K. G. Lynn: Rev. Mod. Phys.60, 701 (1988)
P. J. Simpson, U. G. Akano, P. J. Schultz, I. V. Mitchell: Mater. Sci. Forum105–110, 1435 (1992)
L. Wei, S. Tanigawa, A. Uedono, K. Wada, H. Nakanishi: Jpn. J. Appl. Phys.33, 33 (1994)
P. Willutzki, J. Störmer, G. Kögel, P. Sperr, D. T. Britton, R. Steindl, W. Triftshäuser: Meas. Sci. Technol.5, 548 (1994)
P. Willutzki, J. Störmer, G. Kögel, P. Sperr, D. T. Britton, R. Steindl, W. Triftshäuser: Proc. ICPA-10, ed. by Y. J. He, B. S. Cao, Mater. Sci. Forum175–178, 237 (1995)
G. Dlubek, O. Brümmer, F. Plazaola, P. Hautojärvi, K. Naukarinen: Appl. Phys. Lett.46, 1136 (1985)
Y. Horii, A. Kawasuso, M. Hasegawa, M. Suezawa, S. Yamaguchi, K. Sumino: Mater. Sci. Forum.105–110, 1061 (1992)
T. Bretagnon, S. Dannefaer, D. Kerr: J. Appl. Phys.73, 4697 (1993)
M. J. Puska, S. Mäkinen, M. Manninen, R. M. Nieminen: Phys. Rev. B39, 7666 (1989)
J. Strömer, P. Willutzki, D. T. Britton, G. Kögel, W. Triftshäuser, W. Kiunke, F. Wittman, I. Eisele: Appl. Phys. A61, 71 (1995)
D. T. Britton: Proc. R. Soc. London A445, 57 (1994)
D. T. Britton, P. Willutzki, W. Triftshäuser, E. Hammerl, W. Hansch, I. Eisele: Appl. Phys. A58, 389 (1994)
D. T. Britton, J. Strömer. Appl. Surf. Sci. (submitted)