Abstract
The present article discusses some of the principles underlying the structure of automatic protective circuitry in nuclear reactors, and estimates their reliability in the case of sudden (gross) failures of components.
The results of a reliability analysis of each of the functional and logical circuits using vacuum tubes and semiconductors are discussed.
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Literature cited
M. A. Sintsa, Electronic Equipment Reliability. Symposium [in Russian] (Moscow, Sovetskoe Radio, 1958) p. 40.
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Popov, P.I., Terent'ev, V.G. & Filipchuk, E.V. Stand-by reactor scram systems. The Soviet Journal of Atomic Energy 12, 530–534 (1963). https://doi.org/10.1007/BF01481305
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DOI: https://doi.org/10.1007/BF01481305