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Pulse duration dependence of laser damage mechanisms

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Abstract

A number of mechanisms for internal laser damage in transparent dielectrics are examined for pulse duration dependence and the results are compared with experimental measurements when possible. The differences in dependence on pulse duration and other variables from one mechanism to another suggest that different mechanisms may initiate damage in different parameter ranges. Experimental identification of these mechanisms will be aided by measuring the pulse duration dependence of the damage threshold.

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Abbreviations

α :

bulk absorption coefficient

β :

thermal volume expansion coefficient

C :

heat capacity per unit volume

c :

velocity of light in vacuum

D :

thermal diffusivity

E :

instantaneous electric field strength

E 0 :

electric field amplitude

e :

charge on an electron

e λ :

spectral emissivity at the laser wavelength

ɛ c :

band gap energy

ɛ d :

energy density (energy per unit cross-sectional area)

ɛ e :

electron energy

k :

volume compressibility

k :

wave vector

L :

sample length

L f :

focusing length

λ :

wavelength in vacuum

M :

multiplication factor to correct particle cross-section for Mie effect

m * :

electron effective mass

N :

conduction electron number density

N b :

value ofN required for breakdown

n :

number of photons absorbed inn-photon ionisation

n :

refractive index

n 0 :

original refractive index

n 2 :

coefficient for quadratic term in expression for refractive index

Δn :

change in refractive index

P d :

power density (power per unit cross-sectional area)

R :

inclusion radius

R s :

sample radius

r :

distance from centre of inclusion

r b :

beam radius

S :

breaking strength, damaging stress

T :

temperature

t :

time

t′:

time required to accelerate an electron to the energy of the conduction band

Δt :

pulse duration

τ :

time required for acoustic wave to propagate across the beam

τ e :

conduction electron lifetime

U :

velocity

ω :

angular velocity (frequency times 2π)

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Authors and Affiliations

  1. Air Force Cambridge Research Laboratories, 01730, Bedford, Mass., USA

    E. S. Bliss

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Bliss, E.S. Pulse duration dependence of laser damage mechanisms. Opto-electronics 3, 99–108 (1971). https://doi.org/10.1007/BF01424087

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