Skip to main content
SpringerLink
Log in

Measurement of deformations on microscope UIM-21 for evaluating residual stresses in surface layers of components

  • Published:
Measurement Techniques Aims and scope

Conclusions

The above method is simple to apply, precise, and provides stable results with careful handling. It can be recommended for evaluating residual stresses in upper layers of large details, if the cutting out of a sample from such details is permissible. If it is necessary to determine the stress distribution curve in depth, several samples should be prepared and measured.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

Literature cited

  1. S. O. Tsobkallo and D. M. Vasil'ev, Zavodskaya laboratoriya, No. 2 (1949).

Download references

Authors
  1. O. A. Zherebkin
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Zherebkin, O.A. Measurement of deformations on microscope UIM-21 for evaluating residual stresses in surface layers of components. Meas Tech 6, 203–204 (1963). https://doi.org/10.1007/BF01409253

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF01409253

Keywords

Search

Navigation