Abstract
The plasma resonance in semiconducting CdO with different electron concentrations has been investigated by means of reflectivity measurements on thin films with metallic substrate. The results — especially the dependence of the plasma frequency on carrier density — are discussed within the framework of the classical dispersion theory. At some films peculiarities of the reflectivity have been observed which suggest inhomogeneities of the electron concentration along the layer normal.
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Auszugsweise vorgetragen auf der Tagung des Fachausschusses Halbleiter 1969 in München.
Unser Dank gilt Herrn Dr. Uhle für seine Hilfe bei der numerischen Auswertung der Messungen, der Deutschen Forschungsgemeinschaft für finanzielle Unterstützung.
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Bischoff, M., Finkenrath, H. & Waidelich, W. Optische Plasmaresonanz in CdO. Z. Physik 231, 193–202 (1970). https://doi.org/10.1007/BF01392510
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DOI: https://doi.org/10.1007/BF01392510