Abstract
Photoionisation experiments were performed with heterogeneous Ar-Xe-clusters produced by supersonic expansion of argon gas with small quantities of xenon added to it. A threshold-electron photoionisation (TEPICO) technique was used to obtain time of flight cluster mass spectra. These mass spectra show particularly strong intensities for Ar12Xe+ and Ar18Xe+ which are attributed to the extraordinary stabilities of these cluster ions. Maxima in the ionic size distribution around Ar7Xe+ are related to a particular abundance ofneutral Ar12Xe which is fragmented after ionization. These stabilities are explained in terms of geometries consisting of a central Xe atom or ion surrounded by shells of Ar atoms. Filled shells exhibit particular strong bonding because these exhibit the largest number of atom-atom bonds. This conclusion is supported by simple theoretical calculations. The ionization process is discussed in terms of two direct and one indirect ionization channels the latter one proceeding via an intermediate electronic excitation of the Ar component in the neutral cluster.
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Holub-Krappe, E., Ganteför, G., Bröker, G. et al. Fragmentation spectroscopy of heterogeneous clusters. Z Phys D - Atoms, Molecules and Clusters 10, 319–327 (1988). https://doi.org/10.1007/BF01384867
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DOI: https://doi.org/10.1007/BF01384867