Untersuchung derK-Strahlung beim Elektroneneinfang des Ge⁷¹ mit einem Diffraktionsspektrometer mit gebogenem Kristall

Abstract

The intensity of satellites in the Gallium-x-rays emitted inK-capture of Ge⁷¹ has been measured and found to be (1,3±0,5)×10⁻⁴ perK-capture. A curved-crystal X-ray spectrometer with a radius of curvature of 27 cm was used for the measurement. The satellites are found to be due to double ionisation ofK-shell accompanyingK-capture as described by the theory ofPrimakoff andPorter. The theoretically calculated intensity of X-ray satellites emitted due to double ionisation ofK-shell — (0,9)×10⁻⁴ perK-capture — is in fair agreement with experiment.