Über die charakteristischen Energieverluste bei Elektronenstreuung an Si-Spaltflächen

Abstract

The energy spectrum of electrons scattered inelastically at cleavage surfaces of silicon and germanium into Bragg reflection spots differs from that obtained by transmission by low lying characteristic energy losses. The dependence of their intensity on the order of the diffraction spots, on the surface roughness, and on the angle near the diffraction spot shows that they are due to surface plasma oscillations. The transmission energy spectrum is mainly due to the excitation of volume plasma oscillations.