Abstract
The intensity distribution in the line focus of first-order focusing spectrometers for charged particles is calculated, taking into account the interference effects in the coherently irradiated vicinity of the line focus and the diffraction by a narrow aperture defining slit. The gradual transition of this intensity distribution from that with no aperture limitation to that of a very narrow slit is shown.
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Herrn Professor Dr. K.Zeller danken wir für die Überlassung von Rechenzeit in der Rechenanlage des Rechenzentrums des Mathematischen Instituts der Universität Tübingen.
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Lenz, F., Krimmel, E. Die wellenoptische Intensitätsverteilung im Linienfokus von Spektrometern für geladene Teilchen. Z. Physik 176, 191–196 (1963). https://doi.org/10.1007/BF01380585
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DOI: https://doi.org/10.1007/BF01380585