Abstract
The diffuse elastic scattering of 51 kev electrons of a polycrystalline aluminium foil was measured by means of a retarding field apparatus in the temperature range 150 –800 °K. The temperature diffuse scattering intensityJ TDS was separated from the temperature independent partJ DS of the background intensity. The measured intensityJ TDS shows good agreement with the theoretical angular distribution of the temperature diffuse scattering due to one- and two phonon processes. The value of the mean square displacement\(u^{\bar 2} (T)\), which is required for the theoretical calculation as well as for the experimental determination ofJ TDSwas taken from the measured Debye-Waller factor exp(−2M) for the kinematic reflections of the same foil. The temperature independent partJ DS of the background intensity is mainly due to elastic scattering of electrons in the amorphous oxide layer of the aluminium foil.
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Eine kurze Mitteilung erfolgte bereits in Solid State Comm.2, 339 (1964).
Der Verfasser dankt Herrn Prof. Dr. H.Raether herzlich für viele Anregungen und die großzügige Förderung dieser Arbeit, sowie Herrn Dr. G.Meyer für zahlreiche Diskussionen. Die Deutsche Forschungsgemeinschaft unterstützte diese Arbeit durch die Bereitstellung finanzieller Mittel und verschiedener Geräte.
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Horstmann, M. Messung der thermisch diffusen Elektronenstreuung in polykristallinen Aluminiumschichten. Z. Physik 188, 412–422 (1965). https://doi.org/10.1007/BF01339874
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DOI: https://doi.org/10.1007/BF01339874