Zeitschrift für Physik B Condensed Matter

, Volume 72, Issue 4, pp 497–501 | Cite as

Photon emission with the scanning tunneling microscope

  • J. K. Gimzewski
  • B. Reihl
  • J. H. Coombs
  • R. R. Schlittler
Article

Abstract

By placing a photon detector near the tip-sample region of a scanning tunneling microscope, we have measured isochromat photon-emission spectra of polycrystalline tantalum and Si(111)7×7 at photon energies of 9.5 eV. Such spectra contain electronic-structure information comparable to inverse photoemission spectroscopy, but with high lateral/spatial resolution. The implications of this new observation are discussed.

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Copyright information

© Springer-Verlag 1988

Authors and Affiliations

  • J. K. Gimzewski
    • 1
  • B. Reihl
    • 1
  • J. H. Coombs
    • 1
  • R. R. Schlittler
    • 1
  1. 1.IBM Research DivisionZurich Research LaboratoryRüschlikonSwitzerland

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