Abstract
We have calculated the rate of light emission from a scanning tunneling microscope with an Ir tip probing a silver film. In the calculation we model the tip by a sphere. We find a considerable enhancement of the light emission compared with for example inverse photoemission experiments. This enhancement is explained as the result of an amplification of the electromagnetic field in the area below the microscope tip due to a localised interface plasmon. We estimate that one out of 104 tunneling electrons will emit a photon in the visible range. Due to an electromagnetic decoupling of the sphere from the sample the enhanced emission is lost for photon energies above a certain value. We also find that the experimentally observed maximum in the light emission as a function of bias voltage is related to the behavior of tip-sample separation versus bias voltage.
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Johansson, P., Monreal, R. Theory for photon emission from a scanning tunneling microscope. Z. Physik B - Condensed Matter 84, 269–275 (1991). https://doi.org/10.1007/BF01313548
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DOI: https://doi.org/10.1007/BF01313548