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Coherent X-ray scattering by phonons

Phonon eigenvectors in Si and GaAs

  • Original Contributions
  • Published:
Zeitschrift für Physik B Condensed Matter

Abstract

Interference effects arising from coherently coupled X-ray beams inelastically scattered from phonons have been used to determine phonon eigenvectors in Si and GaAs crystals. An outline of the method, experimental requirements, and theoretical background is presented. The experimental results are analyzed with the help of different lattice dynamical model calculations. Best overall agreement is found with phonon eigendata based on the bond charge model.

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Authors and Affiliations

  1. Institut für Angewandte Physik, Technische Hochschule Darmstadt, Schloßgartenstrasse 7, W-6100, Darmstadt, Germany

    A. Zounek & H. Spalt

  2. Hamburger Synchrotronstrahlungslabor HASYLAB at Deutsches Elektronen-Synchrotron, Notkestrasse 85, W-2000, Hamburg 52, Germany

    G. Materlik

Authors
  1. A. Zounek
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  2. H. Spalt
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  3. G. Materlik
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Zounek, A., Spalt, H. & Materlik, G. Coherent X-ray scattering by phonons. Z. Physik B - Condensed Matter 92, 21–33 (1993). https://doi.org/10.1007/BF01309163

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  • DOI: https://doi.org/10.1007/BF01309163

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