Abstract
The microstructure of electrodeposited amorphous Co−P and Ni−P on a scale of some nm was investigated with the aid of small angle X-ray scattering (SAXS) and transmission electron microscopy (TEM). The combination of the two techniques allowed us to separate the contributions of the surfaces to SAXS. Fork 2>0.6 nm−2 the diagrams could be analyzed with respect to the scattering from the bulk alone. Both methods exhibit a granular structure of the material due to fluctuations of the mass density and the composition on a scale of 2–5 nm. The amplitude of the fluctuations is appreciably higher in Co−P than in Ni−P. There is no evidence that the inhomogeneities may be responsible for the magnetic anisotropy observed on Co−P.
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Sonnberger, R., Bestgen, H. & Dietz, G. The microstructure of amorphous Co−P and Ni−P investigated with TEM and SAXS. Z. Physik B - Condensed Matter 56, 289–295 (1984). https://doi.org/10.1007/BF01306636
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DOI: https://doi.org/10.1007/BF01306636