Abstract
From the Bragg spacings of a whole set {hkl} of equivalent lattice plances related by symmetry, the axial lengths, axial angles and the volume of the unit cell of a highly pure silicon crystal are calculated. In crystal-to-crystal comparison measurements, relative aberrations from the cubic shape in the order of ±2×10−7 are found. With an average value\(\overline {d(220)} = (192,015.558 \pm 0.018)\) fm, a volumev=(0.160193259±0.000000044) nm3 of the unit cell at 22.50°C and vacuum conditions is derived.
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Siegert, H., Becker, P. & Seyfried, P. Determination of silicon unit cell parameters by precision measurements of Bragg plane spacings. Z. Physik B - Condensed Matter 56, 273–278 (1984). https://doi.org/10.1007/BF01306634
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DOI: https://doi.org/10.1007/BF01306634