Abstract
X-ray diffraction is becoming an important tool in the measurements of surface structures. Single crystalline samples are used as in Low Energy Electron Diffraction (LEED)-studies. The X-ray technique is somewhat more involved due to the need of bright, collimated photon sources, in general synchrotron X-rays, and of very accurate angular settings in the ultrahigh-vacuum environment of the sample. We present the technique and discuss examples of experimental results.
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Marra, W.C., Eisenberger, P., Cho, A.Y.: J. Appl. Phys.50 (11) (1979)
Vineyard, G.H.: Phys. Rev. B26, 4146 (1982)
Johnson, R.L., Fock, J.H., Robinson, I.K., Bohr, J., Feidenhansl, R., Als-Nielsen, J., Nielsen, M., Toney, M.: In: Proceedings of the first International Conference on Structures of Surfaces (ICSOS). Berlin, Heidelberg, New York: Springer 1984
Robinson, I.K.: Phys. Rev. Lett.50, 1145 (1983)
Bohr, J., Feidenhansl, R., Nielsen, M., Toney, M., Johnson, R.L., Robinson, I.K.: Phys. Rev. Lett.54, 1275 (1985)
Robinson, I.K.: (to be published)
Brennan, S., Eisenberger, P.: Nucl. Instrum. Methods222A, 164 (1984)
Fuoss, P.H., Robinson, I.K.: Nucl. Instrum. Methods222A, 171 (1984)
Warren, B.E.: X-ray diffraction. Rading, Mass: Addison-Wesley 1968
Robinson, I.K., Fuoss, P., Stark, J., Bennett, P.A.: SSRL Annual Report (1984)
Robinson, I.K.: Proceedings First International Conference on Structure of Surfaces (ICSOS). Berlin, Heidelberg, New York: Springer 1984
Marra, W.C., Fuoss, P.H., Eisenberger, P.E.: Phys. Rev. Lett.49, 1169 (1982)
Feidenhansl, R., Bohr, J., Nielsen, M., Toney, M., Johnson, R.L., Grey, F.: Proceedings 5th General Conference of the Condensed Matter Division of EPS, Berlin, March 18–22, 1985. In: Festkörperprobleme/Advances in Solid State Physics. Vol. XXV
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Nielsen, M. Single crystal surface structure by bragg scattering. Z. Physik B - Condensed Matter 61, 415–420 (1985). https://doi.org/10.1007/BF01303546
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DOI: https://doi.org/10.1007/BF01303546