Abstract
A method is described for the structure determination of surface adsorbates, interfaces and solid-state impurity distributions using x-ray interference fields generated with synchrotron radiation. Recent studies and results are reviewed to illustrate the possibilities of this method for surface and interface physics.
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Materlik, G. Phase boundary studies with x-ray interference fields. Z. Physik B - Condensed Matter 61, 405–409 (1985). https://doi.org/10.1007/BF01303544
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DOI: https://doi.org/10.1007/BF01303544