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A possible new case of total X-ray reflection

  • Physics of Semiconductors and Dielectrics
  • Published:
Soviet Physics Journal Aims and scope

Abstract

A new and quite simple method is proposed for consideration of multiple scattering of an incident ray by elements of a plane lattice. This method is used to obtain a general expression for the amplitude of coherent scattering of photons on an isolated monatomic layer. It is shown that at incident radiation frequencies coinciding with resonant frequencies of the lattice atoms a new phenomenon can develop: total reflection of photons from the isolated atomic layer, independent of the angle of incidence.

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Authors and Affiliations

  1. Physics Institute, Academy of Sciences of the Ukrainian SSR, USSR

    M. I. Faingol'd

Authors
  1. M. I. Faingol'd
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Additional information

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 4, pp. 21–25, April, 1985.

The author is indebted to B. M. Bolotovskii for his valuable remarks and to V. L. Vinetstkii for his fruitful evaluation of the study.

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Faingol'd, M.I. A possible new case of total X-ray reflection. Soviet Physics Journal 28, 269–272 (1985). https://doi.org/10.1007/BF01301552

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  • DOI: https://doi.org/10.1007/BF01301552

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