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Investigation of the oxidation kinetics of silicon carbide heaters

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In the range 1200–1500°C the mechanism of oxidation of industrial heating elements containing 97–99% silicon carbide is approximately identical with, and is controlled in the same way, as the oxidation of pure silicon carbide [1, 2], in the main by oxygen diffusion through a film of SiO2.

The relationship between the oxidation of various silicon carbide heating elements and time is described ⋌ the equation q=Kτb, where b comes within the range 0.3–0.5. The relationship between the oxidation rate of the heating elements and the temperature obeys the Arrhenius equation: K=K0exp(−E/RT).

The calculated activation energy for the process for various heating elements alters from 23 to 43 kcal/mole.

The porosity of the heaters (up to values not exceeding 18%) substantially affects the oxidation capacity.

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Literature cited

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Translated from Ogneupory, No.6, pp. 52–57, June, 1970.

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Gropyanov, V.M., Kuznetsova, V.L. & Laptun, V.I. Investigation of the oxidation kinetics of silicon carbide heaters. Refractories 11, 388–394 (1970). https://doi.org/10.1007/BF01295709

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  • DOI: https://doi.org/10.1007/BF01295709

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