Time-of-flight secondary ion mass spectrometry (TOF-SIMS) of polyisoprenes

Abstract

Polyisoprenes (PIPs) with average molecular weights from 650 to 800,000 Da have been studied by time-of-flight secondary ion mass Spectrometry (TOF-SIMS) in the static mode. Polymer samples were bombarded by argon primary ions, and positive SIMS spectra were collected. Effects of branching and unsaturation in the polymer structure on ion formation were studied. The pendant methyl group showed little tendency to fracture as a cation. In the low mass region, C_nH ⁺_2n−1 appeared to be more intense than C_nH ⁺_2n+1 , attributed to the double bond structure of polyisoprene. Additionally, ion formation varied as a function of polymer molecular weight. Cationized intact oligomers and fragments dominate the high mass region. Oligomer distributions were used to calculate average molecular weights for polyisoprenes. A statistical chain scission mechanism was used to qualitatively explain the formation of five clusters within a unique fragmentation pattern. Detailed studies of the cluster structure pointed out that each cluster contained several species having varied degrees of unsaturation. It is believed that double bond rearrangements occur.