Abstract
Individual particle analysis by means of an automated scanning electron microscope with an energy dispersive X-ray microanalysis system (SEM/EDX) is used for chemical classification and size determination of airborne particulate matter. Special attention is paid to the X-ray analysis of atmospheric soot particles. The preparation and use of standards, which is indispensable for obtaining good results are described and discussed in detail. The aerosol samples were collected on Nuclepore filters of two different pore sizes at a traffic island in Munich.
Similar content being viewed by others
References
J. Heintzenberg, P. Winkler,Fresenius J. Anal. Chem. 1991,340, 540.
C. W. Bruce, T. F. Stromberg, K. P. Gurton, J. B. Mozer,Appl. Optics 1991,30, 1537.
A. Petzold, R. Niessner, in:VDI-Bericht 1059, Ruβmessungen in der Auβenluft-Vergleich verschiedener Methoden, VDI, Düsseldorf, 1993, p. 303.
Tables for Calculation of Smoke Concentration, Warren Spring Laboratory, Stevenage, Hertfordshire, 1965.
P. Sutton,The Assessment of Neighbourhood Impact from National Survey Data, National Society for Clean Air, Brighton, 1981, p. 20.
A. D. A. Hansen, H. Rosen, T. Novakov,Sci. Total Environ. 1984,36, 191.
L. A. Gundel, R. L. Dod, H. Rosen, T. Novakov,Sci. Total Environ. 1984,36, 197.
R. Niessner,J. Aerosol Sci. 1986,17, 705.
S. M. Japar, W. W. Brachaczek, R. A. Gorse,Atmos. Environ. 1986,20, 1281.
H. D. Bauer, D. Dahmann, H. H. Fricke,Staub-Reinhalt. Luft 1991,51, 319.
J. R. Anderson, J. Aggett, P. R. Buseck, M. S. Germani, T. W. Shattuck,Environ. Sci. Technol. 1988,22, 811.
R. Van Grieken, C. Xhoffer,J. Anal. Atomic Spec. 1992,7, 81.
M. S. Germani, P. R. Buseck,Anal. Chem. 1991,63, 2232.
B. Raeymaekers, P. Van Espen, F. Adams,Mikrochim. Acta 1984,II, 437.
J. E. Post, P. R. Buseck,Environ. Sci. Technol. 1984,18, 35.
P. B. DeNee,SEM 1978,I, 479.
E. J. Chatfield, M. J. Dillon,SEM 1978,I, 487.
J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori, E. Lifshin,Scanning Electron Microscopy and X-ray Microanalysis, Plenum, New York, 1981, p. 453.
K. F. J. Heinrich,Electron Beam X-ray Microanalysis, Van Nostrand Reinhold Company, 1981, New York, p. 219.
K. R. Spurny,Physical and Chemical Characterization of Individual Airborne Particles, Ellis Horwood, Chichester, 1986, p. 173.
Link Analytical LTD, Operators Manual, SR2-500-FDC-0784, Bucks, 1984, A4.
G. Spanner, H. Schröder, A. Petzold, R. Niessner,J. Aerosol Sci. 1994, in press.
F. Löffler, C. Wadenpohl, S. Kaufmann,Atmos. Environ. 1993,27A, 1271.
H. M. Köster,Die chemische Silikatanalyse, Springer, Berlin Heidelberg New York, 1979, p. 5.
J. T. Armstrong,SEM 1978,I, 455.
J. A. Small, K. F. J. Heinrich, D. E. Newbury, R. L. Myklebust,SEM 1979,II, 807.
J. W. Criss,Anal. Chem. 1976,48, 179.
F. He, P. J. Van Espen,Anal. Chem. 1991,63, 2237.
J. A. Small,SEM 1981,I, 447.
A. Krasenbrink, B. Georgi, D. Stein, B. Heits, in:VDI-Bericht 1059, Aktuelle Aufgaben der Messtechnik in der Luftreinhaltung, VDI-Verlag, Düsseldorf, 1993, p. 325.
B. Versino, H. Ott,Physico Chemical Behaviour of Atmospheric Pollutants, Reidel, Dordrecht, 1982, p. 257.
G. T. Wolff, R. L. Klimisch,Particulate Carbon-Atmospheric Life Cycle, Plenum, New York, 1982, p. 19.
H. Burtscher,J. Aerosol Sci. 1992,23, 549.
R. C. Henry, G. M. Hidy,Atmos. Environ. 1982,16, 929.
K. T. Whitby,Atmos. Environ. 1978,12, 135.
R. S. Barratt,Int. J. Environ. Anal. Chem. 1990,40, 77.
S. Thono, K. Takahashi,J. Aerosol Sci. 1990,21, 719.
R. W. Linton, D. F. S. Natusch, R. L. Solomon, C. A. Evans,Environ. Sci. Technol. 1980,14, 159.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Fruhstorfer, P., Niessner, R. Identification and classification of airborne soot particles using an automated SEM/EDX. Mikrochim Acta 113, 239–250 (1994). https://doi.org/10.1007/BF01243614
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF01243614