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LED cosmetic flaw vision inspection system

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Abstract

The paper describes a vision inspection system that is developed to detect diffused LED defects, namelyscratches, bubbles, contamination, blister/blemish, fuzzy dome andoff centre defects in less than 200 ms using a 200 MHz Pentium PC, a Matrox Genesis frame grabber and a Pulnix high speed camera. Various image-processing techniques are utilised for the inspection task. A machine vision approach that comprises pre-processing, image segmentation, clean up and feature extraction operations is implemented to perform the automated cosmetic flaw inspection. Based on 200 LED samples, the system was found to be 100% accurate in detecting LED dome defects on LEDs of different colour and intensity. The system can also classify defects into different categories and was found to be 90% accurate.

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Author notes

  1. M. H. Ahmed Fadzil (Associate Professor and Dean)

    Present address: School of Electrical and Electronic Engineering, Universiti Sains Malaysia, Malaysia

Authors and Affiliations

  1. Faculty of Engineering, PETRONAS University of Technology, 31750, Tronoh, Malaysia

    M. H. Ahmed Fadzil (Associate Professor and Dean)

  2. Hewlett Packard Malaysia, Penang, Malaysia

    C. J. Weng

Authors
  1. M. H. Ahmed Fadzil
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  2. C. J. Weng
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Ahmed Fadzil, M.H., Weng, C.J. LED cosmetic flaw vision inspection system. Pattern Analysis & Applic 1, 62–70 (1998). https://doi.org/10.1007/BF01238027

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  • DOI: https://doi.org/10.1007/BF01238027

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