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In this paper the electrical tree growth in solid insulating materials is modeled using von Neumann's Cellular Automata (CA). The model is based upon the assumption that the electric stress at the end of a conducting tip quite often approaches the dielectric strength of the material and that progressive breakdown can occur by electrical tree formation. Because of tree advancement, the potential distribution into the insulating material changes with time and is calculated at each time step. An algorithm for the simulation of electrical tree growth in solid dielectrics based on this model has been developed. The algorithm is also used to simulate breakdown in solid dielectrics containing square or spherical voids.
Übersicht
In diesem Artikel wird das Wachstum der elektrischen Bäume in Festisolierstoffen mittels von Neumannscher zellularer Automaten modelliert. Dieses Modell geht davon aus, daß das elektrische Feld an der Spitze der Elektrode oft in der Nähe der dielektrischen Festigkeit vom Material liegt und das ein fortschreitender Durch-schlag durch elektrische Bäume möglich ist. Durch das Wachsen der elektrischen Bäume ändert sich die Spannungsverteilung innerhalb des Festisolierstoffes mit der Zeit und wird in jedem Zeitschritt berechnet. Ein Algorithmus für die Simulation des Wachstums eines elektrischen Baums in Festisolierstoffen ist entwickelt worden. Der Algorithmus kann auch den Durchschlag in Festisolierstoffen mit zylindrischen oder kugelförmigen Hohlräumen simulieren.
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Karafyllidis, I., Danikas, M.G., Thanailakis, A. et al. Simulation of electrical tree growth in solid insulating materials. Electrical Engineering 81, 183–192 (1998). https://doi.org/10.1007/BF01236238
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DOI: https://doi.org/10.1007/BF01236238