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A new method for measuring the chemical shifts of X-ray emission lines and its application in electron microprobe analysis

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Summary

A new formula for calculating the chemical shift of X-ray lines is theoretically derived. A test of the method is given as well as its application in electron microprobe analysis for the purpose of obtaining some crystal-chemical characteristics of solids.

Zusammenfassung

Eine neue Formel für die Berechnung der chemischen Verschiebung von Röntgenlinien wurde theoretisch abgeleitet. Die Prüfung der Methode und ihre Anwendung in der Elektronenstrahlmikroanalyse für die Ermittlung einiger kristallchemischer Kennzahlen von Festkörpern wurde beschrieben.

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Authors and Affiliations

  1. Department of Chemistry, Leningrad State University, USSR

    N. S. Andrushenko & Yu. P. Kostikov

Authors
  1. N. S. Andrushenko
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  2. Yu. P. Kostikov
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Andrushenko, N.S., Kostikov, Y.P. A new method for measuring the chemical shifts of X-ray emission lines and its application in electron microprobe analysis. Mikrochim Acta 62, 783–790 (1974). https://doi.org/10.1007/BF01218296

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  • DOI: https://doi.org/10.1007/BF01218296

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