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Quantitative electron-probe microanalysis without standards

Quantitative Elektronenstrahl-Mikroanalyse ohne Standard

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Summary

The dependence of the X-ray intensity emitted from the target on the take-off angle is applied to quantitative electron-probe micro-analysis without standards. The take-off angle is varied by rotating the inclined target.

Zusammenfassung

Die Abhängigkeit der Intensität der aus der Probe austretenden X-Strahlen von dem Abgangsfehlerwinkel dient zur quantitativen Elektronen-strahlmikroanalyse ohne Standard. Der Abgangsfehlerwinkel wird durch Drehen der schief gelagerten Probe verändert.

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References

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Authors and Affiliations

  1. A. F. Ioffe Physical-Technical Institute, Academy of Sciences of the USSR, Leningrad, USSR

    K. G. Gartzman & A. N. Efimov

Authors
  1. K. G. Gartzman
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  2. A. N. Efimov
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Gartzman, K.G., Efimov, A.N. Quantitative electron-probe microanalysis without standards. Mikrochim Acta 76, 191–197 (1981). https://doi.org/10.1007/BF01196735

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  • DOI: https://doi.org/10.1007/BF01196735

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