Abstract
Pure and porous silica xerogels doped with CdS nanocrystals have been prepared by a sol-gel process. In order to determine parameters convenient for non-linear optical properties, particle size distributions were obtained by two complementary techniques: transmission electron microscopy (conventional, CTEM, and high resolution, HRTEM) and small angle X-ray scattering (SAXS). Monolithic samples having CdO concentrations varying from 5 to 20 wt% have been studied. Details are given of an image analysis technique used to study the CTEM micrographs.
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Othmani, A., Plenet, J.C., Bernstein, E. et al. Size distribution of CdS nanocrystal-doped silica xerogels. J Mater Sci 30, 2425–2429 (1995). https://doi.org/10.1007/BF01184596
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DOI: https://doi.org/10.1007/BF01184596