Abstract
The electronic contribution to the driving force for segregation to a curved interface between a cylindrical fiber of insulator embedded in a metal matrix is calculated. The solute/curved-interface binding energy is shown to vary as the inverse of the radius of curvature of the interface in the limit of a small radius. This result implies that the propensity for segregation of curved interfaces is larger than that of planar interfaces.
Similar content being viewed by others
References
J.M. Briceno-Valero, “Morphology of grain boundary segregation: effect on grain boundary structure in Al−Zn alloys”, D.O.E. Report, LBL-13626, p. 30 (1981).
G. Allan, Annales de Phys.5, 169 (1970).
L. Dobrzynski, Surf. Sci.180, 489 (1987)
P.M. Morse and H. Feshbach, “Methods of Theoretical Physics”, vol. I, (McGraw-Hill, New York, 1953), p. 827.
J.O. Vasseur, P.A. Deymier, B. Djafari-Rouhani, and L. Dobrzynski, Interface Sci.1, 49 (1993).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Deymier, P.A., Vasseur, J.O. Effect of curvature on interfacial segregation: Electronic contribution to the point defect/interface binding energy. Interface Sci 2, 147–152 (1994). https://doi.org/10.1007/BF01184509
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF01184509