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The study of structural and electrical properties of thin antimony films

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Abstract

Structural and electrical properties of thin antimony films of various thicknesses evaporated on to glass substrates have been studied in the temperature range 150 to 350 K. The structural studies show that the films are polycrystalline having grains whose size increases with thickness. The electrical resistivity is found to increase as thickness decreases, thus exhibiting the size effect. The effect of grain-boundary scattering has been studied using a Mayadas-Shatzkes model and a three-dimensional model. The experimental results on the electrical resistivity are found to be consistent with the three-dimensional model. The specularity parameterp≈ 0.49, and has no temperature dependence. The values of reflection coefficient,R, and transmission coefficient,t, are determined from the experimental data.

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Authors and Affiliations

  1. Department of Physics, Indian Institute of Technology, 208 016, Kanpur, India

    Ajay Kumar & O. P. Katyal

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  1. Ajay Kumar
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  2. O. P. Katyal
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Kumar, A., Katyal, O.P. The study of structural and electrical properties of thin antimony films. J Mater Sci 24, 4037–4041 (1989). https://doi.org/10.1007/BF01168970

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  • DOI: https://doi.org/10.1007/BF01168970

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