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Crystal defects and coherent intergrowth of α- and β-crystals in Y-Ce doped sialon materials

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Abstract

Sialon material doped with a mixture of yttrium and cerium in a molar ratio of 1 to 3, up to a total amount of 6 wt% has been investigated with high resolution transmission electron microscopy (HREM). Theα-sialon crystals were shown to contain defects of types not previously reported. These include stacking faults, shear and coherent intergrowth ofα- andβ-sialon crystals. For some of the defects structural models are proposed and verified by image simulations.

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Olsson, P.O. Crystal defects and coherent intergrowth of α- and β-crystals in Y-Ce doped sialon materials. J Mater Sci 24, 3878–3887 (1989). https://doi.org/10.1007/BF01168950

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