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Analysis of local heat transfer properties of tape-cast AlN ceramics using photothermal reflectance microscopy

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Abstract

Photothermal reflectance microscopy was applied to the analysis of local thermal diffusivity on tape-cast AlN ceramics. The materials were obtained from three different commercial powders, two sintering temperatures (1750 and 1800 °C), and 3 wt % Y2O3 sintering aid. Owing to the high spatial resolution of the technique (∼30 μm in the present case), measurements in different positions on the sample surface were carried out. In this way a study of the homogeneity of thermal properties was performed.

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Authors and Affiliations

  1. Laboratoire d'Instrumentation, Université Pierre et Marie Curie; UPR A0005 du CNRS, 10 rue Vauquelin, 75005, Paris, France

    L. Fabbri, D. Fournier & L. Pottier

  2. CNR-IRTEC, Research Institute for Ceramics Technology, Faenza, Italy

    L. Esposito

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  1. L. Fabbri
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  2. D. Fournier
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  3. L. Pottier
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  4. L. Esposito
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Fabbri, L., Fournier, D., Pottier, L. et al. Analysis of local heat transfer properties of tape-cast AlN ceramics using photothermal reflectance microscopy. J Mater Sci 31, 5429–5436 (1996). https://doi.org/10.1007/BF01159313

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