Abstract
X-ray photoelectron spectroscopy (XPS) has been used to investigate impurity phase segregation at grain boundaries in 10mol% Y2O3-90mol% ZrO2. The segregant material forms a thin film in the intergranular region up to 1400° C. At higher temperatures it redisperses to triple points and the external surface of the compacts used in the experiment. The XPS results indicate that the segregant material is similar to a chain silicate of composition 1.5Na2O∶0.5Y2O3∶3.0SiO2.
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Hughes, A.E., Sexton, B.A. XPS study of an intergranular phase in yttria-zirconia. J Mater Sci 24, 1057–1061 (1989). https://doi.org/10.1007/BF01148798
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DOI: https://doi.org/10.1007/BF01148798