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Microdosimetric approach to analysis of failures in systems of semiconductor devices of a single type under neutron irradiation

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Literature Cited

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Authors
  1. N. G. Goleminov
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  2. V. I. Ivanov
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  3. E. A. Kramer-Ageev
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Additional information

Translated from Atomnaya Énergiya, Vol. 49, No. 6, pp. 373–374, December, 1980.

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Goleminov, N.G., Ivanov, V.I. & Kramer-Ageev, E.A. Microdosimetric approach to analysis of failures in systems of semiconductor devices of a single type under neutron irradiation. At Energy 49, 833–835 (1980). https://doi.org/10.1007/BF01128058

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  • DOI: https://doi.org/10.1007/BF01128058

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