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Component reliability improvement through rejection by nondestructive testing and burn-in

  • Systems Analysis
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Cybernetics and Systems Analysis Aims and scope

Abstract

The paper examines mathematical models of component reliability improvement through rejection by nondestructive testing and burn-in. Component reliability models allowing for the manufacturing process are considered.

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References

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  3. A. G. Alekseenko, Principles of Microcircuit Engineering [in Russian], Sovetskoe Radio, Moscow (1977).

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  4. O. D. Parfenov, Microcircuit Technology [in Russian], Vysshaya Shkola, Moscow (1986).

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  5. I. Bazovsky, Reliability, Theory and Practice [Russian translation], Mir, Moscow (1985).

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Authors
  1. V. A. Arentov
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Additional information

Translated from Kibernetika i Sistemnyi Analiz, No. 3, pp. 73–84, May–June, 1992.

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Arentov, V.A. Component reliability improvement through rejection by nondestructive testing and burn-in. Cybern Syst Anal 28, 386–395 (1992). https://doi.org/10.1007/BF01125419

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  • DOI: https://doi.org/10.1007/BF01125419

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