Abstract
YBa2Cu3O x ceramics were recrystallized in vacuum at high temperatures. Recrystallized layers consisting of small grains were observed near the surfaces of the original large-grain 1 2 3 ceramics. The small grains consisted of transformation twins and were identified to orthorhombic 1 2 3 using X-ray diffraction. As vacuum annealing time increased, the thickness of the recrystallized layer increased. The relationship between the thickness and the annealing time showed a linear relationship and an effective diffusion coefficient of 6.25 × 10−10cm2s−1. The recrystallized layer showed a critical temperature of 90 K.
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Kim, CJ., Shin, WS., Chung, DS. et al. Recrystallization of YBa2Cu3Ox superconductors in vacuum. J Mater Sci 27, 3301–3304 (1992). https://doi.org/10.1007/BF01116028
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DOI: https://doi.org/10.1007/BF01116028