Abstract
We consider the modeling of supply current transients in a digital integrated circuit (DIC) and its application to DIC fault detection. A numerical example is given, in which the proposed model is applied to calculate the DIC diagnostic parameter.
Similar content being viewed by others
Literature cited
A. G. Alekseenko and I. I. Gagurin, Microcircuit Engineering [in Russian], Sovetskoe Radio, Moscow (1982).
S. V. Yakubovskii (ed.), Analog and Digital Integrated Circuits [in Russian], Sovetskoe Radio, Moscow (1979).
D. V. Gaskarov, T. A. Golinkevich, and A. V. Mozgalevskii, Technical State and Reliability Prediction of Radioelectronic Equipment [in Russian], Sovetskoe Radio, Moscow (1974).
N. Draper and H. Smith, Applied Regression Analysis, Wiley, New York (1966).
B. F. Pamekin, Wide-Band Integrated Amplifiers [in Russian], Sovetskoe Radio, Moscow (1980).
I. F. Petersen, “Statistical application problems for the Minsk-32 computer,” Tr. Tallin. Politekhn. Inst., No. 456, 146–312 (1978).
N. P. Stepanenko, Fundamentals of Microelectronics [in Russian], Sovetskoe Radio, Moscow (1980).
Yu. A. Ural'skii, “A model of a logic element and a procedure for analysis of digital integrated circuits,” Elektron. Tekhnika, Ser. 10, No. 4(28), 3–7 (1981).
Author information
Authors and Affiliations
Additional information
Translated from Vychislitel'naya i Prikladnaya Matematika, No. 56, pp. 114–121, 1985
Rights and permissions
About this article
Cite this article
Shapoval, V.B., Solov'ev, V.M. & Zherdev, N.K. Modeling supply current transients in a digital integrated circuit. J Math Sci 54, 854–859 (1991). https://doi.org/10.1007/BF01097600
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF01097600