Skip to main content
Log in

Testing of combinational circuits designed from multivalued logic elements

  • Published:
Cybernetics Aims and scope

    We’re sorry, something doesn't seem to be working properly.

    Please try refreshing the page. If that doesn't work, please contact support so we can address the problem.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Literature Cited

  1. J. P. Roth, “Diagnosis of automata failures: a calculus and a method,” IBM J. Res. Dev.,10, No. 4 (1966).

  2. J. P. Roth, W. G. Bouricius, and P. R. Schneider, “Programmed algorithms to compute tests to detect and distinguish between failures in logic circuits,” IEEE Trans. Electron. Comput.,EC-16 (1967).

Download references

Authors

Additional information

Translated from Kibernetika, No. 4, pp. 47–55, July–August, 1978.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Brovarnik, V.V. Testing of combinational circuits designed from multivalued logic elements. Cybern Syst Anal 14, 530–539 (1978). https://doi.org/10.1007/BF01069833

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF01069833

Keywords

Navigation