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Medium range order in high surface area amorphous silicas

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Abstract

Medium-range order (MRO) in amorphous (a-) SiO2 can be defined as the degree of orientational correlation between neighbouring SiO4/2 tetrahedra. Analysis of X-ray diffraction data on high surface area a-silicas shows that the MRO can be characterized quantitatively by means of (a) the first peak position in the interference function and (b) the ratio between O-O(II) and Si-O(II) coordination heights in the pair distribution function. These two quantities are physically related.

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Authors and Affiliations

  1. Institute of Physics and Technology of Materials, P.O.B. MG 7, Bucharest, Magurele, Romania

    R. Manaila

  2. Research Centre for Physical Chemistry, Bucharest, Romania

    M. Zaharescu

Authors
  1. R. Manaila
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  2. M. Zaharescu
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Manaila, R., Zaharescu, M. Medium range order in high surface area amorphous silicas. J Mater Sci 25, 2095–2099 (1990). https://doi.org/10.1007/BF01045771

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  • DOI: https://doi.org/10.1007/BF01045771

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