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Damage mechanisms, optimum choice of material, and diagnosis of exit window of high-power gyrotron

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Literature Cited

  1. Klystron Design Handbook, Defense Industry Press, Beijing (1979), p. 165.

  2. K. Domingos and R. Anderson. An Evaluation of Silicon-on-Sapphire Technology, Washington (1976), p. 14.

  3. Liubao Liu, Brazing of Vacuum Devices and Metal Ceramic Sealing, Defense Industry Press, Beijing (1978), p. 8.

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  4. Shaoming Shi, J. Electron.,4, No. 6, 393 (1983).

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  5. E. E. Wahlstron, Optical Crystallography, Wiley, New York (1979), p. 86.

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Authors
  1. Shaoming Shi
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Additional information

Institute of Radio Engineering and Electronics, Academy of Sciences of People's Republic of China. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Radiofizika, Vol. 35, No. 6/7, pp. 622–625, June–July, 1992.

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Shi, S. Damage mechanisms, optimum choice of material, and diagnosis of exit window of high-power gyrotron. Radiophys Quantum Electron 35, 402–403 (1992). https://doi.org/10.1007/BF01041794

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  • DOI: https://doi.org/10.1007/BF01041794

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